Design for Testability

• Boundary-Scan-Standards
• Boundary-Scan
• Built-in-Logic-Block-Observer-BILBO
• Built-in-Self-Testing-BIST
• Combinational-Logic-Testing
• Controllability
• Fault-Coverage
• Fault-Modeling
• Full-Scan
• IC-Testing
• JTAG-TAP-Controller
• JTAG
• Linear-Feedback-Shift-Register-LFSR
• Need-of-Design-for-Testability
• Observability
• Partial-Scan
• Scan-Path-Testing
• Signature-Analysis
• Stuck-open-and-Stuck-short-Faults